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Optimizing Product Development with Optical 3-D Metrology

Four workshops offer insights, networking, and free 3-D scanning analysis

Capture 3D
Thu, 03/31/2011 - 09:59
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(Capture 3D: Costa Mesa, CA) -- Capture 3D, along with GOM mbH and Trilion Quality Systems, will be hosting four day-long workshops geared toward optimizing product development processes, saving time, cutting costs, and working more efficiently through the use of 3-D metrology technology. Bring your part for a complimentary 3-D scanning analysis for real-time results. Gain insight on how other companies are utilizing optical measurement throughout their entire product life cycles, and network with other industry professionals. This conference is geared for engineers, management, and executives. Space is limited, so register today.

ADVERTISEMENT

Workshop: Optimizing Product Development with Advanced Full-Field Optical 3-D Metrology Technology 

Cost: FREE (includes breakfast and lunch) 

Time and dates:

• 8:30 a.m.–3 p.m., May 10, 2011, in Huntsville, Alabama
• 8:30 a.m.–3 p.m., May 17, 2011, in Detroit
• 8:30 a.m.–3 p.m., May 24, 2011, in Long Beach, California
• 8:30 a.m.–3 p.m., June 13, 2011, in Houston

 …

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