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Surface Engineers Can Now Get Improved Chemical Detection, Analysis

New Thermo Scientific K-Alpha features improved spectroscopic performance during chemical surface characterization

Thermo Fisher Scientific Inc.
Mon, 10/18/2010 - 14:12
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(Thermo Fisher Scientific: Madison, WI) -- Thermo Fisher Scientific Inc., a global player in serving science, recently announced the launch of the new version of the Thermo Scientific K-Alpha X-ray photoelectron spectrometer (XPS). This fully integrated surface characterization tool is designed to meet the demands of surface engineers whether working in cutting-edge research and development of new surface chemistries, or dealing with routine characterization of surfaces, thin films, and coatings.

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The original K-Alpha was designed to offer scientists and engineers a new XPS solution by offering unprecedented ease of operation, and a streamlined workflow via the Thermo Scientific Avantage data system. The latest revision of the award-winning K-Alpha platform has those same valued benefits plus dramatically improved spectroscopic performance, delivering increased count rates, faster analysis times, and improved chemical detection. Further enhancements include improvements to the unique sample viewing system, better automation, and a new glove box option for handling air-sensitive samples.

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