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Product News: X-Ray Diffraction Instrument Features 3-D Detection System

PANalytical’s Empyrean—the world of XRD analysis is no longer flat.

Mon, 06/21/2010 - 12:31
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(PANalytical: Almelo, the Netherlands) -- Global X-ray analytical instrument manufacturer, PANalytical, has changed the game in multipurpose X-ray diffraction (XRD) with the launch of its Empyrean high-performance diffractometer. Every major element of Empyrean is new: the X-ray source, the state-of-the-art goniometer, the sample stages, and the radiation enclosure. The instrument also introduces PIXcel3D, the world’s first 3-D detection system.

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As a result, Empyrean is unique in its ability to measure all sample types—from powders to thin films, from nanomaterials to 3-D objects—on a single instrument. Users can switch between application setups in a fast and cost-effective way using PANalytical’s proven PreFIX modules, with no compromise on the quality of diffraction data. Empyrean is easy to use, too. Dedicated hardware, software, and regulatory expertise incorporated in predefined programs, and customizable desktop and batch sample capabilities, help make advanced functions accessible to all.

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