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Product News: OIM 6.0 Electron Backscatter Diffraction Software

EDAX Inc.'s release is written for 64-bit processor and is compatible with Microsoft Windows 7.

EDAX Inc.
Fri, 06/11/2010 - 11:56
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(EDAX Inc.: Mahwah, NJ) -- EDAX Inc., part of AMETEK Inc.’s Material Analysis Division, a provider of X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM 6.0. The software is the first microanalysis package written for 64-bit processor and Microsoft Windows 7-compatibility, and its datasets include more than 40 million data points.

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OIM software offers easier access to the most commonly used functions along with one-button analysis. Among the latest features incorporated into OIM 6.0 are expanded QuickGen and template functionality, full-image area mapping, easier data rotations, interactive page colors, and password-protected, system-level settings. OIM 6.0 also offers improved user access with advanced visualization tools, an interactive status bar, and data processing log to automatically record post processing performed on datasets.

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