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CMSC 2010 Spotlights 25 Technical Papers on Precision Measurement, Inspection

CMSC also features a keynote speaker, exhibition hall, and four workshops.

CMSC
Wed, 06/09/2010 - 14:15
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(CMS: Benbrook, TX)-- The Coordinate Metrology Society (CMS) has announced the organization has chosen 25 technical white papers to be presented at its annual Coordinate Metrology Systems Conference (CMSC), July 12–16, at the world class Grand Sierra Resort located in Reno.

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White paper submissions were received from metrology experts and scientists from research laboratories, universities, and leading manufacturers in North America, Eastern and Western Europe, India, and Japan. Topics to be presented are as diverse as the speaker roster and include aligning the James Webb Space Telescope, Airbus A320 aircraft assembly-line alignment, and other applications of photogrammetry, laser trackers, articulating arms, laser radar, 3-D scanners, 3-D vision systems, and more. A full listing of the CMSC 2010 white papers, as well as conference registration information, can be found at www.cmsc.org.

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