(CRC Press: Boca Raton, FL) -- A new book published May 19 by CRC Press, Essential Project Management Sk

(PANalytical: Almelo, the Netherlands) -- PANalytical has extended the compatibility of its Omnian advanced standardless analysis software to now include the compact benchtop MiniPal 4 X-ray fluorescence (XRF) spectrometer.

(Cognex: Natick, MA) -- Cognex Corp. has announced a new option to deliver its VisionView operator interface to any VGA display.

(SME: Dearborn, MI) -- A long-time advocate of lean practices, the Society of Manufacturing Engineers (SME) member and author, Mark Hamel, has been awarded The Shingo Prize Research and Professional Publications Award for the

(Eriez Manufacturing Co.: Erie, PA) -- Eriez’ E-Z Tec X-ray Inspection Systems deliver the highest level of product and packaging integrity for pharmaceutical applications.

(Leica Geosystems: Norcross, GA) -- Following the successful Q4 2009 release of its Leica ScanStation C10 laser scanner, Leica Geosystems announces new system enhancements tha

(Canon Communications: Los Angeles, CA) -- Canon Communications has announced that its biennial regional edition of Quality Expo enjoyed a successful debut last month in Charlotte, North Carolina.

(Paton Professional: Chico, CA) -- That people and companies will have problems is a given: It’s the way that they face and respond to their problems that will dictate success o

(FARO Technologies: Minneapolis) -- Laser Design Inc. and FARO Technologies have partnered in developing a next generation scanning technology system, the Magnaline 240.

(InfinityQS: Chantilly, VA) -- InfinityQS has announced that Donald J. Wheeler will be the keynote speaker for Infusion 2010, the fourth annual user conference for InfinityQS quality systems. Infusion 2010 will be held at The Westin Grand in Washington, D.C., on Oct. 24–27.