(MTConnect: McLean, VA -- MTConnect Institute, an organization that develops and provides open standards intended to foster greater interoperability between manufacturing controls, devices, and software applications, has released “Getting Started with MTConnect—Connectivity Guide.” The gu

(FDAnews: Falls Church, VA) -- FDAnews has announced details of its upcoming 4th Annual Risk Management and Drug Safety Summit: Building an Effective Global Risk Management and Drug Safety Program, scheduled for Nov. 1–2, 2011, in Washington D.C.

(National Instruments: Austin, TX) -- National Instruments (NI) has opened registration for the 2011 NI Technical Symposium, a series of daylong events that showcase the latest NI technologies and development techniques for engineers an

(UC Davis: Davis, CA) -- A $1.3 million grant to develop a new food-safety training program for government and industry has been awarded by the U.S. Food and Drug Administration (FDA) to the University of California, Davis, School of Veterinary Medicine.

(SME: Chicago) -- This November, at FABTECH 2011 in Chicago, Chris Kuehl, Ph.D., economic analyst for the Fabricators & Manufacturers Association International (

(AMETEK: Kleve, Germany) -- SPECTRO Analytical Instruments, a unit of AMETEK Materials Analysis Division and a leading supplier of analytical instruments for optical emission and XRF spectrometry, has introduced the next-generation SPECTRO xSORT handheld energy-dispersive X-ray fluorescence (

(Olympus: Center Valley, PA) -- The First Surface Metrology Seminar for the Americas will convene at Worcester Polytechnic Institute (WPI), Oct.

(Wiley: Hoboken, NJ) -- Optimal Design of Experiments: A Case Study Approach, by Peter Goos and Bradley Jones (Wiley, 2011), demonstrates the utility of the computer-aided optimal design approach using real industrial examples.

(Quality Digest: Chico, CA) -- Former Motorola Chairman and CEO Robert W. Galvin died on October 11, 2011, at the age of 89. Bob Galvin served the company for nearly 60 years and transformed it from a U.S.

(Mitutoyo: Aurora, IL) -- The new CRYSTA-Apex S coordinate measuring machine (CMM) from Mitutoyo brings new levels of performance and economy to the 1.7 μm class of CNC coordinate measuring machines (CMMs).