ANSI: Improved Standards Access Through National Standards Search Engine
(ANSI: Washington, D.C.) -- The American National Standards Institute (ANSI) has released a workshop report on the status
(ANSI: Washington, D.C.) -- The American National Standards Institute (ANSI) has released a workshop report on the status
(Basler: Ahrensburg, Germany) -- Digital industrial camera specialist Basler will soon be starting series production of its ace GigE camera models with powerful CMV2000 and CMV4000 complementary metal-oxide semiconductor (CMOS) sensors by CMOSIS, Antwerp, Belgium-based developer, manufacturer, an
(AIAG: Southfield, MI) -- The Automotive Industry Action Group (AIAG), developer and promoter of solutions to help manufacturing and service providers operate at peak performance, has introduced a new membership benefits package designed to provide automotive manufacturers and suppliers easier ac
(AMA: New York) -- Women negotiate all day, every day, often without even realizing they are in a bargaining situation. Whether the negotiation is a small, everyday matter, or a bigger, more structured deal, making the most of these conversations is imperative.
(Banner Medical: Carol Stream, IL) -- Banner Medical executives Vince Adams, vice president of Sales, Marketing and Strategic Planning; and Bob Khin, quality assurance director; along with Peter Johns, supplier quality manager for Pioneer Surgical, will participate on a faculty panel at the upcom
(Gartner: Stamford, CT) -- Global research and advisory firm Gartner Inc. has revealed its annual ranking of the top supply-chain organizations headquartered in Asia-Pacific.
(ASTM: West Conshohocken, PA) -- ASTM International, known worldwide for developing test methods and its 13,000+ technical standards and thousands of related publications, is launching two new journals: Advances in Civil Engineering Materials (ACEM) and Materials Performance and Char
(Nikon Metrology: Brighton, MI) -- As simple to use as a digital camera, the NeoScope II is a high-resolution scanning electron microscope (SEM) that produces images with a large depth of field at magnifications ranging from 10X–60,000X.
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