(Palisade: Ithaca, NY) -- Risk and decision analysis software specialist, Palisade Corp., has announced its decision to sponsor the Society of Decision Professionals www.decisionprofessionals.com.

(Xradia: Concord, CA) -- A new lab-based computed tomography (CT) system, capable of delivering synchrotron-like 3-D imaging at 50 nanometer (nm) resolution within a laboratory setting, was announced today by Xradia Inc.

(BSI: Reston, VA) -- The British Standards Institution (BSI) announces its next webinar, “The Value of an Environmental Management System,” which will be held Sept. 9 at 1 p.m. EDT.

(Aven Inc.: Ann Arbor, MI) -- Three new color cameras from Aven Inc. can upgrade any microscope with one-click image capture and storage capability. The scientific-grade imaging systems include software with extensive options for user-defined processing, measurement, and analysis.

(MasterControl Inc: Salt Lake City) -- MasterControl Inc., a global provider of software solutions that enable regulated companies to get their products to market faster while reducing overall costs and increasing internal efficiency, has announced that its software solution suite is now availab

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(Harvard SEAS: Cambridge, MA; University of Leeds: Leeds, UK) --  A collaborative team of applied scientists from Harvard University and the University of Leeds have demonstrated a new terahertz (THz) semiconductor laser that emits beams with a much smaller divergence than conventional THz laser

(Cognex Corp.: Natick, MA) -- Cognex Corp. has introduced the In-Sight 5605, a high-resolution, self-contained, flexible vision system for applications that require visualization of very small defects, even in a large field of view.

(Pointools: Barnet, UK) --  A high-tech digital map created with laser-scanning technology is underway for the Flanders region of Belgium.

(CENAM: Santiago de Queretaro, Mexico) -- The committee from Mexico’s national metrology center, Centro Nacional de Metrología (CENAM), invites researchers, professionals, and all personnel in the metrology field to participate