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CloudNC Introduces CAM Assist Software

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(CloudNC: London) -- CAM Assist, from CloudNC, automatically generates professional machining strategies in seconds at the click of a button, accelerating CAM programming time by up to 80% and saving hundreds of production hours.

Renishaw Launches inLux SEM Raman Interface

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(Renishaw: West Dundee, IL) -- Renishaw, pioneer in combining Raman spectroscopy with scanning electron microscopes (SEMs), has launched the inLux SEM Raman interface.

ETL-Rated Hazardous Location Position Sensors Ensure Accurate Valve Position

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(NewTek Sensor Solutions: Pennsauken, NJ) -- Major chemical companies are using hazardous location position sensors from NewTek Sensor Solutions to monitor the state of different valves throughout their plants as part of process safety and efficiency management.

Renishaw Central Delivers the Factory of the Future, Today

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(Renishaw: West Dundee, IL) -- Renishaw’s new central manufacturing connectivity and data platform is p

Wafer Automatic Measurement Solution from Nikon

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(Nikon Industrial Metrology: Brighton, MI) -- The Industrial Metrology business unit of Nikon Corp.

Quantum Study Reveals Potential for Sensing at the Nanoscale

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(ORNL: Oak Ridge, TN) -- A new nanoscience study led by a researcher at the U.S. Department of Energy’s Oak Ridge National Laboratory takes a big-picture look at how scientists study materials at the smallest scales.

Tilted CT Improves X-ray Inspection of Flat Components

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(Nikon Metrology: Brighton, MI) -- A pioneering X-ray computed laminography (CL) technique has been introduced by the Industrial Metrology business unit of Nikon for nondestructively inspecting challenging

Key Technology Introduces COMPASS Optical Sorters

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Mecmesin Expands OmniTest UTM Range

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Mettler Toledo Presents New Product Inspection Systems

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