NIST Releases Atom-Based Standards for Measuring Tiny Chip Features
Device features on computer chips as small as 40 nm can now be measured reliably thanks to a new test structure developed by the National Institute of Standards and Technology.
Web-Based Fundamentals of GD&T Course Available
Effective Training Inc. recently added a new Web-based course to its list of geometric dimensioning and tolerancing services.FARO Receives $1.7 Million in New Airbus Orders
FARO Technologies Inc. recently received $1.7 million in FARO Laser Tracker orders from Airbus S.A.S.
Blue Mountain Quality Resources Expands Training Schedule
Blue Mountain Quality Resources Inc.Starrett Celebrates 125th Anniversary
2005 marks the 125th anniversary of The L.S.Leica Geosystems Receives Imaging Award
Leica Geosystems, an advanced metrology supplier, recently received the prestigious Imaging Solution of the Year award from Advanced Imaging magazine.Metris USA Opens Michigan Technology Center
Metris USA recently opened its new Michigan Technology Center, the latest phase in the metrology company’s $2 million expansion.FeinFocus Opens New Office in China
FeinFocus recently opened a new office in Shanghai to provide sales and technical support to the growing Asian market.Laboratory Testing Inc. NDT Manager Receives Level III Radiography Certification
The American Society for Nondestructive Testing recently awarded Mark Tierney a certificate for NDT Level III in radiography.Tierney, who is manager of NDT services at LabSypris Consolidates Maryland and New Jersey Calibration Labs
Sypris Test & Measurement recently consolidated its calibration laboratory in Annapolis Junction, Maryland, with its new facility in Sayreville, New Jersey.