(Delcam plc: Birmingham, United Kingdom) -- Delcam plc demonstrated Version 5 of its PowerINSPECT software at the IMTS exhibition held in Chicago from September 8-13. This new release of the world’s most successful hardware-independent inspection software includes support for five-axis scan
(Creaform: Los Angeles, Calif.) -- Creaform, developer and manufacturer of the well-known Handyscan 3-D lineup of hand-held and self-positioning laser scanners, once again pushes the limits of portable 3-D scanning and introduces its newest and most innovative product: the VIUscan, a self-positi
(Verisurf Software: Anaheim, Calif.) -- Verisurf Software, an advanced technology company that revolutionized manufacturing in the 1990s by providing breakthrough inspection, tool building, reverse-engineering, instrument interchangeability, and reporting capabilities from a single interface,
(NDI: Waterloo, Canada) --NDI has announced the launch of the OPTOTRAK ScanTRAK advanced hand-held laser scanning system, a bundled solution and shop floor innovation that combines the power of optical measurement with large-volume, point-cloud laser scanning.
(Metris: Leuven, Belgium) -- Metris (Euronext—MTRS) launches LC60D, a next-generation digital 3-D line scanner. Equipped with state-of-the-art digital technology and powerful on-board data processing, the LC60D scanner more than triples today’s common scan rates.
(CogniTens: Wixom, Mich.) -- CogniTens, a Hexagon Metrology company, and InnovMetric Software announced today the signature of a software di
(CNC Software Inc., Educational Division: Gig Harbor, Washington) -- Connecticut manufacturers and community colleges have requested that graduates of Manufacturing Technology programs within the Connecticut Technical High School System be well versed in computer-aided manufacturing (CAM).
(NIST: Gaithersburg, Maryland) -- The National Institute of Standards and Technology and the University of Maryland Biotechnology Institute (UMBI) will cosponsor an international conference on “Accelerating Innovation in 21st Century Biosciences: Identifying the Measurement Standards and Technol
(NIST: Gaithersburg, Maryland) -- Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, resear
