Fourth Annual Ultrasound World Conference
(UE Systems: Elmsford, New York) -- Ultrasound World IV, January 27–30, 2008 at the Clearwater Hilton in Clearwater, Florida, offers numerous lectures and
Improved Quality in the New Leica TPS1200+ Total Station
(Leica Geosystems Inc.: Atlanta, Georgia) -- The TPS1200+ Total Station introduces Leica’s most precise automatic positioning ever, along with sever
Automated XRF Online Test for Fast Alloy Quality Control
(Innov-X: Woburn, Massachusetts) -- Innov-X has installed two systems for online quality control testing of stainless steel tubes at Sandvik Materials
RFID-Based Reel Detection
(Cogiscan Inc.: Bromont, Quebec) In collaboration with strategic partners, Fuji, Juki, and Siemens, Cogiscan Inc., introduced its RFID Smart R
Compliance Path to All GNSS Systems
(Leica Geosystems: St.
Light Measurement Seminar
(Labsphere Inc.: North Sutton, New Hampshire) -- Labsphere Inc.
Magnetic Properties of Thin Films
(NIST: Gaithersburg, Maryland) -- Materials researchers at the National Institute of Standards and Technology, together with colle
3-D Laser Scanner at York Technical College
(Laser Design Inc.: Minneapolis) -- York Technical College is a community college with associate degree and certificate programs.
2008 Measurement Science Conference
The 2008 Measurement Science Conference welcomes Miguel Cerezo, of Amgen, as the President of the 2008 MSC. The MSC will be held at the Disneyland Hotel during the week of March 10 through 14, 2008, and will present the latest educational information available as in the previous conferences.
Microwave Network Analyzer
(Agilent Technologies Inc.: Santa Clara, California) -- Agilent has announced the availability of a new embedded local oscillator (LO)
