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Xspect Solutions Reincarnates Monster DEA Gantry CMM for SES

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(Xspect Solutions Inc.: Wixcom, MI) -- Xspect Solutions is the world’s largest supplier of rebuilt and remanufactured coordinate measurement machines (CMMs), and has extensive expertise in the area of large CMMs.

Product News: TempTrackr Wireless Temperature Measurement System Kit

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(SenGenuity: Hudson, NH) -- SenGenuity, the sensors division of Vectron International, announced that its TempTrackr Wireless Temperature Measurement System Kit is now capable of reading six independent, passive, wireless temperature sensors.

Product News: Cognex VisionPro Software Expands Image Acquisition Options

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(Cognex: Natick, MA) -- Cognex Corp. announces VisionPro 6.0, a new release of the company’s popular, hardware-independent vision software. VisionPro 6.0 has more acquisition options, higher accuracy calibration, and expanded ID reading capability. 

Product News: ARTEL MVS to Launch at LabAutomation2010

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(Artel: Westbrook, ME) -- The ARTEL Multichannel Verification System (MVS), an objective performance assessment and optimization tool for automated liquid handlers, will be launched at LabAutomation2010, in Palm Springs, California, on Jan. 24–26.

Product News: Qioptiq Introduces The Fetura Vision Metrology System

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(Qioptiq: Rochester, NY) -- Qioptiq announces the introduction of a new line of high-performance vision metrology systems designed for streamlined user interface and maximum productivity in noncontact dimensional measurement.

Tackle Web Guiding and Edge Control with Laser Profile Sensors

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(Bytewise Measurement Systems: Columbus, GA) -- Bytewise Measurement Systems explains why the affordable CrossCheck laser profile sensors are perfectly suited to monitor and control web-based and extruded materials.

Product News: Fluke 435 Power Quality Analyzer

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(Advanced Test Equipment Rentals: San Diego) -- The Fluke 435 three-phase power quality analyzer helps locate, predict, prevent, and troubleshoot problems in three- and single-phase power dis

Product News: Line-Mountable XRF Yield-Management Tool

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(Solar Metrology: Halbrook, NY) -- Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.

Product News: DuraScan Micro/Macro Hardness Testers

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(Struers Inc.: Westlake, OH) -- Struers Inc. introduces its new state-of-the-art micro/macro hardness testing product line, the DuraScan. With its extensive features and benefits, the DuraScan is a natural complement to Struers existing hardness testers.

Product News: Hexagon Metrology Announces PC-DMIS 2009 MR1

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(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology announces the release of PC-DMIS 2009 Minor Release 1 (MR1), an incremental update to PC-DMIS 2009, which was newly released in July 2009.

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