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Four-in-One IMU Simplifies Navigation and Locating

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(Analog Devices) -- Analog Devices Inc.

Hall Sensors for Extended Position Measurement

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(Micronas: Freiburg, Germany) -- Micronas, a leading supplier of sensor and IC system solutions for automotive and industrial electronics, presents a new generation of Hall sensors for linear position measurement with their HAL 38xy family.

Ametek Introduces Jofra PTC Series Temperature Calibrators

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(AMETEK: Largo, FL) -- AMETEK Test & Calibration Instruments works continually to improve the performance, accuracy, convenience, and functionality of its line of advanced dry-block calibrators.

Listening with One Atom

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A lab, though it may seem quiet and insulated, can be as full of background noise as a crowded train station when you’re trying to catch announcements.

Radio-Wave Probe and Tool-Measuring System

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(Hexagon Metrology: Cobham, Surrey, UK) -

Micro-Indentation Hardness Testers Set New Performance Standards

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(Buehler: Lake Bluff, IL) -- By combining the industry’s most intuitive user interface, custom-designed optics, USB data communication, LED illumination, six turret positions, and an integrated digital camera, Buehler’s MicroMet 6000 Series establishes a new class of dead-weight micro-indentation

Compact Color Meters Will Travel

  • Read more about Compact Color Meters Will Travel
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(Cole-Parmer: Vernon Hills, IL) -- Cole-Parmer introduces their Compact Color Meters—ideal for checking painted surfaces, plastics, graphics, paper, textile, pharmaceutical

DataMan 500 Delivers Quick Barcode Reading for Manufacturing

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(Cognex Corp.: Natick, MA) -- The high-performance, fixed-mount barcode reader, DataMan 500, from Cognex is now available for factory automation applications. DataMan 500 is the first ID reader to be powered by a proprietary vision chip, Cognex VSoC.

Digital Cameras Ideal for Contrast Methods in Light Microscopy

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(Warner Instruments: Hamden, CT) -- Warner Instruments has introduced a line of ProgRes Digital CMOS and CCD microscope cameras.

CMSC 2011 to Feature 26 Technical Papers on 3-D Metrology Applications

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(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has chosen 26 technical white papers to be presented at its annual Coordinate Metrology Systems Conference (CMSC), scheduled for July 25–29, 2011, at the Arizona Biltmore Ho

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