Joe Bioty Resumes COO Reins at Automated Precision Inc.
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(Automated Precision Inc.: Rockville, MD) -- Automated Precision Inc.
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(Automated Precision Inc.: Rockville, MD) -- Automated Precision Inc.
(FARO Technologies Inc.: Lake Mary, FL) -- FARO Technologies Inc. (NASDAQ: FARO), the world’s leading provider of portable measurement and imaging solutions, celebrates 30 years in business in 2011.
(Metrologic Group: Wixom, MI) -- Over the last 15 years, Metrolog, the 3-D control software product from the Metrologic Group, has emerged as the benchmark industrial application for any kind of 3-D measurements.
(Chrysler Group LLC: Auburn Hills, MI) -- In January 2010, an ATOS IIe white-light scanning system at Chrysler Group's Scientific Test Labs, Aero/Thermal, was looking a bit like PIXAR's Wall-E and badly in need of an update. The technology was at the end of its usable life-cycle.
(AAM Group: Australia) -- The most evolved and comprehensive mobile laser scanning system in the world is now available from AAM. The Optech Lynx M1 Mobile Mapper represents the next generation in rapid collection of survey-grade 3-D data.
(Siemens PLM Software: Plano, TX) -- NX product design software, from Siemens PLM Software, now supports high-definition 3-D (HD3D) and visual reporting.
(JAI: San Jose, CA) -- JAI announces that it has begun shipping the AT-140GE and the AT-200GE, the latest in its industry-leading 3-CCD color camera series. The company had previously launched versions of these cameras with Camera Link digital interfaces.
(The Coordinate Metrology Society: Benbrook, TX) -- The Coordinate Metrology Society, the preminent membership association for measurement professionals, will hold their 27th Annual Coordinate Metrology Systems Conference (CMSC) July 25–29 at the Arizona Biltmore Hotel in Phoenix, Arizona.
(Dynamic Intelligent Solutions: Clinton Township, MI) -- The ability to pinpoint a product’s dimensional profile before and after exposure to temperature and humidity extremes is a standard testing practice, but the ability to measure a component’s shape during exposure to harsh conditions is a n
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