{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

User account menu
Main navigation
  • Topics
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • 3D Metrology-CMSC
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Contact
    • Training

IAF to Meet in San Francisco

Quality Digest
Tue, 02/13/2007 - 22:00
  • Comment
  • RSS

Social Sharing block

  • Print
Body

San Francisco will be the site of a week-long meeting of the International Accreditation Forum’s technical and executive committees.
Held at the Hilton San Francisco, March 24–30, the event will be hosted by the ANSI-RAB National Accreditation Board (ANAB). The IAF’s technical committees for ISO/IEC 17024, ISO 20000, and its accreditation auditing practices group, among others, will have meetings at the conference, as will ANAB’s board of directors.

Industry Day, on March 28, will serve as a forum for attendees to discuss issues and ideas for improvement to the conformity assessment system.

“This will be the first major event hosted by IAF to bring together industry representatives and stakeholders of the conformity assessment process to discuss their needs and expectations,” explains Robert King, ANAB president.

For more information, visit http://www.anab.org/HTMLFiles/IAF2007home.htm.

 …

Want to continue?
Log in or create a FREE account.
Enter your username or email address
Enter the password that accompanies your username.
By logging in you agree to receive communication from Quality Digest. Privacy Policy.
Create a FREE account
Forgot My Password

Add new comment

Image CAPTCHA
Enter the characters shown in the image.
Please login to comment.
      

© 2025 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us
  • Contact Us