(Olympus) -- Olympus will put its expertise in industrial microscopes, videoscopes, and imaging devices on full display in Booth E-5291 at IMTS 2012 from September 10-15. In-booth talks from a variety of speakers will review topics in non-destructive testing, including visual inspection and motion analysis, as well as the speed of new XRF technologies.
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Christopher A. Brown, PhD, PE, FASME, Director of Worcester Polytechnic Institute Surface Metrology Laboratory, will serve as the company’s featured speaker. Chair of ASME B46, Committee for Classification and Designation of Surfaces, he will discuss the identification, measurement, and calculation of surface roughness.
The complete speaker schedule is as follows:
Monday, September 10
• 11:00AM— Prof. Christopher A. Brown, PhD, PE, FASME
Roughness Revealed: What is Roughness?
• 1:00PM— Mike Kelley, Olympus
The Benefits of Non Destructive Testing, Visual Inspection, and Motion Analysis
• 2:00PM—Prof. Christopher A. Brown, PhD, PE, FASME
Roughness Revealed: Measuring Roughness
• 3:00PM—Tom Leone, Olympus
New XRF Technologies Speed: Simplify & Automate NDT-PMI Inspections
• 4:00PM—Prof. Christopher A. Brown, PhD, PE, FASME
Roughness Revealed: Calculating Roughness
Tuesday-Thursday, September 11-13
• 11:00AM—Prof. Christopher A. Brown, PhD, PE, FASME
Roughness Revealed: What is Roughness?
• 1:00PM—Paul Gabriel, Olympus
The Benefits of Non Destructive Testing, Visual Inspection, and Motion Analysis
• 2:00PM—Prof. Christopher A. Brown, PhD, PE, FASME
Roughness Revealed: Measuring Roughness
• 3:00PM—Tom Leone, Olympus
New XRF Technologies Speed: Simplify & Automate NDT-PMI Inspections
• 4:00PM—Prof. Christopher A. Brown, PhD, PE, FASME
Roughness Revealed: Calculating Roughness
Notable booth demonstrations in microscopy and metrology will include the new DSX Series opto-digital micro-imaging and metrology system, featuring first-in-its-class touchscreen controls, and the LEXT OLS4000 Confocal Optical Microscopy System for nanometer-level imaging, 3D measurement, and roughness measurement. Other demonstrations will include the OmniScan MX2 multi-technology flaw detector for phased array and eddy current array testing as well as the Delta Premium handheld XRF analyzer, designed for determining the alloy chemistry and grade ID of incoming material inspection.
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