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Metrology Conference to Showcase 15 White Papers From Around the World

Published: Monday, June 20, 2005 - 22:00

The Coordinate Metrology Systems Conference 2005, to be held July 18-22 in Austin, Texas, will present 15 white papers written by metrology experts and scientists from all over the world. The selected white papers cover a wide range of 3-D industrial-measurement applications and topics that cater to the specific interests of manufacturers, engineers, scientists, quality control specialists, metrologists, educators and students.

The event, also sponsored by Quality Digest, includes presentations by metrology specialists from prominent laboratories and leading manufacturers in the world, and a vendor hall showcasing the new trends and technologies in the industry.

Established 21 years ago, the Coordinate Metrology Systems Conference is a five-day event held each year at a different location. It’s renowned for its comprehensive program of white papers and applications presentations given by worldwide industry experts.

To attend the conference, or for more information on the conference program, visit www.cmsc.org.


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For 40 years Quality Digest has been the go-to source for all things quality. Our newsletter, Quality Digest, shares expert commentary and relevant industry resources to assist our readers in their quest for continuous improvement. Our website includes every column and article from the newsletter since May 2009 as well as back issues of Quality Digest magazine to August 1995. We are committed to promoting a view wherein quality is not a niche, but an integral part of every phase of manufacturing and services.