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Steinbichler Presents Portable Surface Testing and T-SCAN Sensor

Both will be unveiled at CONTROL 2012, May 8–11

Steinbichler
Tue, 04/10/2012 - 13:08
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(Steinbichler: Plymouth, MI) -- Steinbichler, a global supplier of optical measuring and sensor technology, will present two new products at the CONTROL 2012 trade fair (hall 5 stand 5304) held May 8–11, 2012. The STEINBICHLER ABIS optimizer, is the world’s first portable surface-testing system with depth evaluation and an objective surface evaluation; and the STEINBICHLER T-SCAN is a new laser scanner with considerably improved performance.

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 “The ABIS optimizer, a logical development from the numerous automatic ABIS systems already used on the market, is especially developed for applications at an extremely early stage of the manufacturing process, and is consistently equipped with all of the necessary technical features required for this,” says Hans Weigert, head of sales and marketing at  Steinbichler Optotechnik. The new T-SCAN, on the other hand, offers a data transfer rate that is up to 30 times higher than its predecessor and achieves a previously unseen performance, thanks to its larger line thickness and a higher stand-off.”

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