(Konica Minolta Sensing: Ramsey, NJ) -- Konica Minolta Sensing Americas Inc. (KMSA), a global provider of industrial measurement of color, light, and shape instruments, is introducing a full line of photovoltaic measurement and characterization instruments to the U.S. market at the SPIE Optics and Photonics 2010 show being held at the San Diego Convention Center in San Diego on Aug. 1 through Aug. 5.

At the center of the measurement solutions presented at the show, KMSA will be showcasing its new pseudo reference cell. This cell is the product of cooperation by Konica Minolta Sensing and the National Institute of Advanced Industrial Science and Technology (AIST), a research organization in Japan. The reference cell is used as a standard point of calibration to ensure consistent measurements of newly developed photovoltaic cells.

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