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Product News: NPFLEX 3D Metrology System for Characterizing Difficult Surfaces

Rapid, 3-D surface characterization for large samples

Veeco Instruments Inc.
Wed, 09/15/2010 - 12:11
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(Veeco Instruments Inc.: Tucson, AZ) -- In booth No. E-5439 at IMTS 2010, Veeco Instruments Inc. will display its NPFLEX 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation. The NPFLEX3D surface profiler combines the industry-leading performance of Veeco’s noncontact, white-light optical profilers with a unique open-access design to enable rapid, 3-D data acquisition and analysis on a wide range of large samples for precision machining applications in the medical implant, aerospace, and automotive market sectors.

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