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Quality Digest


phoenix/x-ray Wins Global Technology Award

Published: Wednesday, November 8, 2006 - 23:00

phoenix/x-ray Systems + Services received a Global Technology Award for its nanotom, a 160kV nanofocus computed-tomography system.

The award was presented by Global SMT & Packaging magazine during the Assembly Technology Expo in Chicago. The panel of experts selected the nanotom for the award in recognition of its innovative design and varied uses.

The nanotom is the first system of its kind to cater specifically to the materials sciences, electronics and semiconductor industries. It allows the analysis of samples from 120 mm in diameter and up to 1kg in weight. And with feature recognition down to 300 nm (1 micron = 1,000 nm), the finest details of a specimen can be displayed. As an example of this resolution, see the image at left of a 25 micron bond wire which was thermically destroyed by overcurrent.

phoenix/x-ray is on the Web at www.microfocus-x-ray.com/frameset.php?Language=en.


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