(Keyence: Woodcliff Lake, NJ) --The Keyence VK-X Series 3-D laser scanning microscopes combine the capabilities of SEMs and noncontact roughness gauges with the simplicity of an optical microscope. This newly released system now boasts an unprecedented 0.5 nanometer Z-axis resolution with a magnification range spanning 200x–24,000x. The usability and ease-of-use have been further improved with the addition of the AI-Scan function, allowing users to image and measure a target with just a click of the mouse.

With high-resolution color imaging and nanometer-level profile measurement functions, the VK-X Series laser scanning microscopes have been designed to overcome the inadequacies of conventional imaging and profiling technologies. A short-wavelength laser scans across a target to provide noncontact profile, roughness, and thickness measurements—even on targets with highly angular surfaces. By combining the laser with an industry-leading, 16-bit photomultiplier, the VK-X can obtain an image and measurement on nearly any type of material, as well as thickness measurements on transparent films and coatings.

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