(CRAIC: San Dimas, CA) -- CRAIC Technologies, a leading innovator of ultraviolet–visible-near infrared (UV-visible-NIR) microspectroscopy solutions, has introduced the 20/20 XL UV-visible-NIR microspectrophotometer. The 20/20 XL microspectrophotometer is designed to nondestructively analyze microscopic features of very large displays by being capable of incorporating large-scale sample handling.

With the microspectrophotometer’s spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, luminescence, and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic samples in the UV and NIR regions, in addition to color imaging.

Due to its flexible design, which gives it the ability to analyze the largest displays, applications are numerous and include mapping color and intensity variations, taking film thickness measurements, and even scanning the surfaces of display components for defects. With the ability to spectral-analyze and -image microscopic features of very large devices, the 20/20 XL microspectrophotometer is the cutting-edge micro-analysis tool for laboratories and manufacturing facilities.

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