{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

        
User account menu
Main navigation
  • Topics
    • Customer Care
    • Regulated Industries
    • Research & Tech
    • Quality Improvement Tools
    • People Management
    • Metrology
    • Manufacturing
    • Roadshow
    • QMS & Standards
    • Statistical Methods
    • Resource Management
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • Customer Care
    • Regulated Industries
    • Research & Tech
    • Quality Improvement Tools
    • People Management
    • Metrology
    • Manufacturing
    • Roadshow
    • QMS & Standards
    • Statistical Methods
    • Supply Chain
    • Resource Management
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Contact
    • Training

High-Resolution, Extended SWIR Camera for Beam Profiling

Supports extended SWIR wavelength response for beam profiling from the visible to 2050 nm using single imager

Wed, 02/09/2022 - 11:57
  • Comment
  • RSS

Social Sharing block

  • Print
Body

(Princeton Infrared Technologies: Monmouth Junction, NJ) -- Princeton Infrared Technologies (PIRT), specialists in indium gallium arsenide (InGaAs) imaging technology and affordable shortwave-infrared (SWIR) linescan cameras, visible-SWIR science cameras, and 1- and 2D imaging arrays, has introduced the 1280BPCam, an extended-SWIR response camera developed specifically for laser beam profiling.

ADVERTISEMENT

The new InGaAs/GaAsSb (InGaAs/gallium arsenide antimonide) type-II super lattice (T2SL) detector features 1280 x 1024 pixels on a small 12-µm array pitch that delivers 90 frames per second (fps) at full resolution. The extended wavelength response of the T2SL material, plus the three-stage thermoelectric cooler (TEC), enable high sensitivity from 400 nm to 2050 nm, making it possible to image from the visible out to the SWIR spectrum with a single imager. The high-resolution imagers are specially fabricated on 100 mm substrates to enable low-cost production.

 …

Want to continue?
Log in or create a FREE account.
Enter your username or email address
Enter the password that accompanies your username.
By logging in you agree to receive communication from Quality Digest. Privacy Policy.
Create a FREE account
Forgot My Password
Top Stories
AI May Be Making Your Quality Problem Worse
The 6 Best Quality Management Software Features That Simplify Your QMS
What I Discovered About Quality Concepts by Watching My Newborn Granddaughter
Why Products Still Fail RoHS, REACH, and POPs Compliance
The Hidden Cost of Poor Quality in Regulated Manufacturing

Add new comment

Please login to comment.

© 2026 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us
  • Contact Us