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Quality Digest


Flagship CT Scanner for Industrial Inspection Offered by Waygate Technologies

Versatile CT solution for a range of 3D metrology, research, and evaluation applications

Published: Thursday, May 25, 2023 - 12:00

(Waygate Technologies: Huerth, Germany) -- Waygate Technologies, a Baker Hughes business and leader in nondestructive testing (NDT) solutions for industrial inspection, announced a flagship computed tomography (CT) solution called Phoenix V|tome|x M Omni. Designed to replace the company’s most popular CT system, it builds on the success and proven technology of the Phoenix V|tome|x M, adding many features that increase flexibility, speed, and detection quality.

The CT solution is suitable for a range of 3D metrology, research, and evaluation applications in the laboratory environment, as well as automated precision inspection in production. The Phoenix V|tome|x M Omni will serve many key industries, including battery inspection in the e-mobility and electronics sectors, and manifold applications in the aerospace industry, among others. The system will be available toward the end of this year.

Built on a successful legacy

The Phoenix V|tome|x M Omni is based on Waygate Technologies’ Phoenix V|tome|x platform, the most widely used solution for industrial CT systems. Among the key features are the proprietary Scatter|correct solution, which eliminates scatter at the click of a button; high-flux|target, which provides faster scan results; and the exclusive Dynamic 41 detectors, which offer higher resolution and brightness.

Advanced functions for industrial applications

The Phoenix V|tome|x M Omni includes an increased scan envelope, additional workflow and integration options, improved metrology accuracy, and accessibility of key components for ease of use and serviceability.

Optimized image quality is provided by the two horizontally installed tubes: a 300 kV/500 W microfocus tube for imaging dense parts, and a 180 kV/20 W nanofocus tube for imaging with even higher resolution.

The system is designed to increase serviceability and productivity with an easy-to-access maintenance door and a reengineered manipulator that improves efficiency. The new cabinet includes a large sliding door, making sample loading and unloading easier. It also has versatile loading options that can handle heavy objects using an internal or external crane. The system offers an increased scan envelope for large samples up to 75 kg with a movable detector for effective scanning results of smaller samples.

In addition, the Phoenix V|tome|x M Omni includes a space-saving control desk that enhances workflow flexibility and integrated workflows for automated defect recognition (ADR) with the proprietary X|approver software, as well as a new standardized interface ready for integration into automated workflows with robotic and other at-line inspection solutions.

Award-winning design

Although the CT system is not yet on the market, the Phoenix V|tome|x M Omni was recently awarded the iF Design Award 2023, an international design competition prize that has been awarded annually since 1954. Jurors evaluated the product in terms of its idea, form, function, differentiation, and effect. This year, there were more than 10,000 submissions by more than 4,700 participants. The form and function of the Phoenix V|tome|x M Omni were particularly praised, receiving the highest scores for practical but stylish design.

“Our goal is to continuously improve our solutions by staying on the cutting edge of technology and exploring new possibilities,” says Ben Linke, CEO of Waygate Technologies. “It’s therefore a source of pride for us to have developed the Phoenix V|tome|x M Omni, a versatile product with which we’re introducing new, valuable features and serving strategically important growth markets. Receiving the iF Design Award underlines our commitment not only to functionality, but also to usability and design, which we believe are essential for developing truly effective solutions.”


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