(Brunson: Kansas City, MO) -- Brunson Instrument Company has introduced the new ArmBar:250, a 250-mm reference artifact allowing dual-process verification of the arm’s probing tip or scanner functions. Using Brunson’s patented Low Thermal Expansion (LTE) design, the ArmBar:250 gains additional stability and measurement predictability through a kinematic mount.

“We’ve listened carefully to our customers’ needs and created a metrology product that helps bring peace of mind to the CMM arm user,” says Mark Meuret, Brunson’s director of engineering.

The ArmBar:250 provides critical verification for contact or non-contact devices. The reference artifact features two, 1” diameter, grade 50, satin-finish spheres and two 6 mm probe tip seats. The ArmBar:250 is easily mounted to a work cart, can be bolted to a table, or clamped to any horizontal surface. The MSRP for the Brunson ArmBar:250 is $1,425.

The ArmBar:250 is serialized and its lengths are certified. The ArmBar:250 is kinematically mounted to an aluminum base plate and is easily portable; additionally, a protective, hard-plastic storage case is available.

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