Electronic applications typically have challenging surfaces, angles, steps, and structures that must be measured during development. Whether it is circuit-board flatness or microstructures on the board itself, precise measurement is crucial. Components continue to shrink in size, and surfaces become problematic, but measurements must still be precise.

Because precision measurement is vital to end use, it is crucial to monitor and control the end result. Understanding surface roughness, planarity, flatness, and other qualities allows manufacturers to adapt the most effective processing and control measures. Ensuring the quality control of such parameters requires quantifiable, reproducible, and reliable inspection of the electronic applications. Nanovea 3D noncontact profilometers use chromatic confocal technology to measure applications found within microelectronics. Where other techniques fail to provide reliable data due to probe contact, surface variation, angle, absorption or reflectivity, Nanovea profilometers succeed.

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