(ZEISS: Maple Grove, MN) -- ZEISS Industrial Quality Solutions USA announced major updates to its ZEISS PiWeb quality data management platform, expanding automation, real-time analytics, and enterprise-wide connectivity for manufacturers facing increasing production demands and growing quality complexity.

The latest ZEISS PiWeb release brings enhanced statistical process control (SPC), customizable alerts, expanded API connectivity, barcode-enabled workflows, multilingual reporting, and automatic integration of surface, form, and geometry (SF&G) measurement data, helping manufacturers centralize quality intelligence among systems and teams.

As manufacturers accelerate output and continue to invest in digital technologies, quality teams are under pressure to analyze more data, respond faster to process variation, and improve collaboration across global operations. Many organizations still struggle with disconnected inspection systems, spreadsheet-based reporting, siloed databases, and inconsistent reporting standards between suppliers, plants, and OEMs.

ZEISS PiWeb addresses these challenges with new capabilities designed for connected, real-time quality management.

Automatic SF&G data integration: Surface, form, and geometry (SF&G) data, including surface finish, contour, roundness, and form measurements critical in automotive, aerospace, medical device, and precision manufacturing applications, can now be automatically imported into ZEISS PiWeb alongside data from coordinate measuring machines (CMMs), industrial CT scanners, and 3D scanners.

Proactive alerts and notifications: Manufacturers can customize alarms and notifications to identify trends, tolerance issues, and process risks before they escalate into costly production problems.

Expanded system connectivity: Open APIs allow ZEISS PiWeb to improve traceability and visibility.

Global collaboration through translation: AI-powered report translation capabilities improve communication and transparency for international teams, suppliers, and manufacturing sites by translating reports into preferred languages.

Barcode-enabled automation: New barcode functionality enables users to open and share reports across devices, streamlining workflows and reducing manual steps.

Advanced Six Sigma SPC analytics: ZEISS PiWeb now supports real-time SPC calculations aligned with Six Sigma methodologies, including expanded control charts and capability analysis tools for deeper process evaluation.

Improved transparency and traceability: A redesigned statistical analysis interface provides a graphic representation of how results are generated, improving auditability and user confidence in quality decisions.

By combining inspection data, analytics, and workflow automation into a centralized platform, ZEISS PiWeb helps manufacturers reduce manual reporting, accelerate root-cause analysis, improve supplier collaboration, and scale production without sacrificing quality in increasingly data-driven manufacturing environments.

Learn more and request a demo at www.zeiss.com/metrology.