(Renishaw: West Dundee, IL) -- Renishaw, pioneer in combining Raman spectroscopy with scanning electron microscopes (SEMs), has launched the inLux SEM Raman interface. Adding the inLux interface enables in situ Raman spectroscopy for highly specific chemical and structural characterization that complements SEM information. The inLux interface is compatible with SEMs from all major manufacturers and can be easily added to new or existing instruments onsite. The innovative design of the interface allows Raman measurements to be performed while the sample is under the SEM beam, providing simultaneous Raman, photoluminescence (PL), or cathodoluminescence (CL) measurements with SEM imaging, making experimental workflows easier and faster.

The inLux interface is used without having to move the sample, even when performing mapping measurements, for simple and accurate correlation between the Raman data and SEM images. When not in use, the inLux probe can be withdrawn from the SEM chamber for completely independent use of the SEM.

 …