Featured Product
This Week in Quality Digest Live
Innovation Features
Eric Whitley
Robotic efficiency coupled with human intuition yields a fast, accurate, adaptable manufacturing system
InnovMetric Software
One software capable of operating portable metrology equipment and CMMs within the same user interface
MIT News
Mens, Manus and Machina (M3S) will design technology and training programs for human-machine collaboration
Gleb Tsipursky
The future of work is here, and AI is the driving force
Del Williams
Starting up on time and with confidence

More Features

Innovation News
System could be used to aid monitoring climate and coastal change
Simplify shop floor training through dynamic skills management
Oct. 17–18, 2023, in Sterling Heights, Michigan
Enables scanning electron microscopes to perform in situ Raman spectroscopy
Showcasing the latest in digital transformation for validation professionals in life sciences
Supports back-end process control
Transforming the development and optimization of bioprocesses using Tetra data
For processed, frozen, and preprocessed vegetables, confections, and more
Signalysis SigQC software now fully integrated with MECALC QuantusSeries instrumentation

More News

Quality Digest


Renishaw Launches inLux SEM Raman Interface

Enables scanning electron microscopes to perform in situ Raman spectroscopy

Published: Wednesday, September 20, 2023 - 11:59

(Renishaw: West Dundee, IL) -- Renishaw, pioneer in combining Raman spectroscopy with scanning electron microscopes (SEMs), has launched the inLux SEM Raman interface. Adding the inLux interface enables in situ Raman spectroscopy for highly specific chemical and structural characterization that complements SEM information. The inLux interface is compatible with SEMs from all major manufacturers and can be easily added to new or existing instruments onsite. The innovative design of the interface allows Raman measurements to be performed while the sample is under the SEM beam, providing simultaneous Raman, photoluminescence (PL), or cathodoluminescence (CL) measurements with SEM imaging, making experimental workflows easier and faster.

The inLux interface is used without having to move the sample, even when performing mapping measurements, for simple and accurate correlation between the Raman data and SEM images. When not in use, the inLux probe can be withdrawn from the SEM chamber for completely independent use of the SEM.

Users can collect spectra from single points, multiple points, or generate 2D and 3D confocal Raman images. The inLux interface comes fully equipped for all this work as standard, enabling analysis of areas larger than 0.5 mm in each axis. Fully encoded position control, down to 50 nm, assures precise sample movement.
“Renishaw has been making combined SEM Raman solutions for over 20 years, and the inLux interface is the culmination of our expertise,” said Tim Batten, Renishaw’s spectroscopy platform product manager. “It has been specifically designed as an easy-to-use, bolt-on SEM accessory, opening the world of Raman analysis to all SEM users.”
The inLux interface can be fitted with up to three fiber-optic modules—two different Raman excitation wavelengths from 405 nm to 785 nm, and an optional CL probe. These modules offer flexibility when dealing with fluorescent or challenging samples. The interface is used in conjunction with Renishaw’s research-grade Raman spectrometers and software to provide comprehensive processing and analysis capabilities while being intuitively simple to use. From industrial contamination identification to academic research, the inLux interface can help get the most from SEM measurements.

For further information on the inLux SEM Raman interface, visit www.renishaw.com/inlux.


About The Author

Quality Digest’s picture

Quality Digest

For 40 years Quality Digest has been the go-to source for all things quality. Our newsletter, Quality Digest, shares expert commentary and relevant industry resources to assist our readers in their quest for continuous improvement. Our website includes every column and article from the newsletter since May 2009 as well as back issues of Quality Digest magazine to August 1995. We are committed to promoting a view wherein quality is not a niche, but an integral part of every phase of manufacturing and services.