(ZEISS: White Plains, NY) -- ZEISS announces the introduction of its highly flexible and efficient software suite, ZEN core, for operating all ZEISS scanning electron microscopes (SEMs), including focused ion-beam scanning electron microscopes (FIB-SEMs).

ZEISS Efficient Navigation (ZEN) enables microscopists to obtain more meaningful information. Users across various fields—including materials research, natural resources, electronics, and life sciences—in both industry and academia can perform exactly the microscopy workflows they need in their laboratories. The software streamlines image acquisition, analysis, and data management.

ZEISS’s ZEN core now includes basic control of SEMs and FIB-SEMs. Both nonexperts and experienced professionals benefit from the integration of SEM imaging and EDS analytics, as well as enhancements in AI-based workflows. FIB-SEM users can maximize throughput reliably by using the fully automated TEM lamella preparation.

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