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Full 3-D Feature and Surface Inspection with Metris XC65D Digital Cross Scanner

Published: Sunday, May 17, 2009 - 14:26

(Metris: Leuven, Belgium) -- At Control 2009, Metris launched the multilaser XC65D scanner that captures all 3-D details of features, edges, pockets, ribs, and freeform surfaces in a single scan. The cross scanner’s entirely digital operation boosts scanning frequency and drives intelligent laser intensity adaptation to scan any surface without user interaction. The superior performance of XC65D further accelerates the digital inspection process, providing better insight, more flexibility, and much higher productivity.

Real 3-D measurement through multilaser technology

Incorporating three lasers in a cross pattern, the XC65D obtains a full 3-D view that accurately captures the bore of a hole or the flanges of a notch. In this way geometric features can be extracted from the acquired point cloud with higher confidence and accuracy. The XC65D avoids taking multiple scans of the same feature using different scanner paths and orientations, eliminating time-consuming probe-head indexing and drastically reducing overall inspection time. With laser stripes being projected from three sides, the XC65D also provides maximum coverage of complex surfaces with many ribs and pockets.

Digitizing any surface without user interaction

To effectively scan surfaces with varying color or high reflectivity, Metris introduces third-generation enhanced sensor performance (ESP3).

Dynamic point-per-point adaption of laser source intensity enables the XC65D to deal with nearly all sample materials and surface finishes without operator interaction. This also includes shiny surfaces and abrupt surface type transitions under any lighting conditions. ESP3 is a key differentiator when scanning similar parts in different manufacturing stages; initially dealing with bare sheet metal parts and finally scanning finished products painted in any color.

Digital technology boosts scanning productivity

The XC65D cross scanner sets new productivity standards by introducing wider laser stripes and high-speed CMOS camera technology, which triples scanning frequency compared to its predecessor. This allows the velocity of the XC65D scanner to be increased drastically, boosting the number of features that can be scanned in the same time frame. Temperature stability is built in through intelligent airflow management and software compensation measures. They minimize warm-up time and guarantee reliable accuracy under shop floor conditions.

3-D view speeds up sheet metal feature inspection

Full 3-D feature inspection is key in realizing fast and flawless product assembly. The scanner traces potential assembly issues up front by accurately digitizing the complete geometry of slots, notches, and edges as well as specialized geometric features, including connection pins, welded bolts, T-studs, and so-called Christmas trees. Besides the regular XC65D scanner, Metris offers the XC65D-LS variant with a higher standoff distance.
This scanner variant gains better access to cavity surfaces of body-in-white structures, and scans over fixture clamps without scanner path modification.

A critical factor in the digital inspection process

The XC65D cross scanner combined with point cloud software innovations increases productivity in every stage of the digital inspection process.

Metris Focus Scan software offers semi-automatic scanner path generation that guarantees full surface coverage and allows you to start scanning within minutes after loading the CAD file. The digital XC65D cross scanner with full 3-D view digitizes the entire part surface and all features at unparalleled speed. In focus inspection, analysis on the basis of part-to-CAD deviation reports provides instant geometric insight.


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The Coordinate Metrology Society (CMS)—presenter of the Coordinate Metrology Society Conference (CMSC)—is comprised of users, service providers, and OEMs of close-tolerance, industrial coordinate measurement systems, software, and peripherals. The metrology systems represented at the annual CMSC include articulated-arm CMMs, laser trackers, laser radar, photogrammetry and videogrammetry systems, scanners, indoor GPS, and laser projection systems. The CMS gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data.