When it comes to metrology, particularly as it applies to portable 3-D applications, no organization is more committed to this discipline than the Coordinate Metrology Society (CMS). Each year, the CMS welcomes abstracts for presentations and technical papers for its annual Coordinate Metrology Systems Conference (CMSC). The CMS heads to New Orleans for its 28th annual event from July 16–20, 2012. And if New Orleans isn’t enough enticement, a wealth of technical information and best practices will be covered by metrology professionals from leading manufacturers, science laboratories, and academia.

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