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Belinda Jones

CMSC

CMSC 2013 Shines in Sunny San Diego

Published: Wednesday, August 14, 2013 - 10:08

Location, location, location! Last month, a diverse assortment of metrologists, scientists, engineers, quality control specialists, manufacturers, educators, and students streamed into the 2013 Coordinate Metrology Systems Conference (CMSC). This annual event was staged at the beautiful Sheraton San Diego Hotel and Marina in downtown San Diego. I must report the weather and the venue were sublime for the 29th gathering of the Coordinate Metrology Society (CMS).

The marine skyline in sunny California wasn’t the only attraction to lure more than 500 measurement and inspection professionals to the conference. Perhaps it was the packed exhibition hall or the record-breaking 27 technical presentations. It might have been the portable 3D metrology certification program, the workshops, the user group meetings, or the sumptuous banquet. Whatever the appeal, the event’s congenial, educational atmosphere keeps those who want to broaden their skill sets and knowledge of 3D portable measurement coming back year after year.

Portable metrology experts cover wide spectrum of industrial measurement applications

This year’s technical presentations covered a wide range of topics: measuring devices’ accuracy and performance; metrology in aerospace, tooling, and manufacturing; integration of laser trackers and robotics; coordinate measurement systems; equipment optimization; 3D scanning and sensors; and other applications in quality control, production, and precision assembly. The presenters hailed from:
• The Boeing Co.
• Lockheed Martin
• AIP Aerospace
• Electroimpact
• Nuclear AMRC/Manchester University (UK)
• National Institute of Standards and Technology (NIST)
• UNC Charlotte
• National Physical Laboratory (NPL, UK)
• Fermilab
• ISRO Satellite Centre (India)
• University of Ontario Institute of Technology (Canada)
• University of Bath (UK)

The speaker roster included four academic institutions, six science laboratories, nine master technology users, four metrology service providers, and four OEMs.

Special guests from NIST and ASTM International also updated the audience on the progress of emerging industry standards and initiatives.

CMS launches first Level-One Certification Program at CMSC 2013

After five years of dedicated work, the  Coordinate Metrology Society launched the industry’s first Level-One Certification Program for Portable 3D Metrology.  The certification examinations were held in a private setting during the week, and attracted representatives from the automotive and nuclear industries. The CMS Certification credential helps to quantify an employee’s knowledge of metrology, which is essential to ISO-certified manufacturers and companies with quality management systems.

Applicants for the Level-One Certification must submit an application, meet eligibility requirements, sign the CMS code of ethics, and pass a peer review. The Level-One examination is a proctored, online assessment covering foundational theory and practice common to most portable 3D metrology devices.

The Level-Two Certification exam on a portable coordinate measuring machine (CMM) was also piloted at this year’s conference.

A packed exhibition hall, fourth annual measurement study

The CMSC also showcased 49 exhibitors in the spacious exhibition hall where attendees could view and discuss new products, services, and solutions for their portable metrology requirements. The conference also offered advanced workshops covering geometric dimensioning and tolerancing (GD&T), the CMSC Measurement Study review, and good measurement practice tips.

After the successful gauge repeatability and reproducibility (R&R) study in 2010, the Coordinate Measurement Society has organized large-scale, interactive studies each year in the exhibition area. Garnering enthusiastic participation from conference attendees, this year’s study evaluated how the decisions made by metrologists, during and after measurement, affect the measurement result. The objective of the study was to engage the metrology community in practical methodology required to support certified operators and programmers. The results of the study will be released later this year.

The conference agenda also included user group meetings, networking events, the popular 5 Billion Micron Fun Run/Walk, and the annual CMSC banquet. Many CMSC visitors attended the Friday tour of the USS Midway Museum in downtown San Diego.

The civic-minded Coordinate Metrology Society also made a generous donation in support of the local Jacobs & Cushman San Diego Food Bank.

2014 CMS officer slate

The Coordinate Metrology Society also elected officers for the 2014 membership year. Robert McIvor presided as the chairman of this year’s conference, and will serve as past chairman next year. Ron Hicks will serve as the 2014 CMSC Chairman, with Ron Rode in the supporting role of vice chairman. Other members serving on the 2013 CMS Executive Committee are Michael Raphael, Scott Sandwith, Gary Confalone, Randy Gruver, Nick Moffitt, Rina Molari, Jafar Jamshidi, Lisa Spoon, Jan Rode, Cali Schwartzly, Tara Mitchell, and Ulysses Green. Nathalie Blanco and Keith Bevan were elected to serve on the 2014 Executive Committee.

To learn more about the Coordinate Metrology Society and the 2014 CMSC to be held in North Charleston, South Carolina, visit www.cmsc.org regularly, as the website is updated throughout the year.

Join the Coordinate Metrology Society

The Coordinate Metrology Society is a membership of users, service providers, and OEMs of close-tolerance industrial coordinate measurement systems, software, and peripherals. The society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information about the CMS, their CMS Certification program, and how to join the organization, visit the society’s website at www.cmsc.org.

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About The Author

Belinda Jones’s picture

Belinda Jones

Belinda Jones is the founder and owner of HiTech Marketing LLC located in Westbrook, Connecticut. For more than a decade, Jones has written articles and commentaries about manufacturing, engineering, quality assurance, CAD/CAM/CAE applications, and other high-tech topics. She has extensive experience in marketing communications, technical sales, and applications engineering. Before joining the computer industry, she was a broadcast copywriter for four years. Jones holds degrees in fine arts and mechanical engineering, and studied cultural arts in Europe.