Lean Boot Camp: Training a Lean Champion
(GA Tech: Atlanta) -- Dive into lean thinking with our Aug.
(GA Tech: Atlanta) -- Dive into lean thinking with our Aug.
(Carl Zeiss: Phoenix, AZ) -- At the 2012 Microscopy & Microanalysis conference in Phoenix, Carl Zeiss Microscopy introduced an extension of its Field Emission Scanning Electron Microscope (FE-SEM) platform MERLIN.
(Nikon: Brighton, MI) -- The newest product in Nikon’s iGPS family is the i5 Integrated Sensor (i5is), a fully integrated five-degree-of-freedom measurement device offering higher accuracy over an extended range, ideal for applications ranging from vehicle tracking to automated assembly of large
(The Conference Board: New York) -- The Conference Board Employment Trends Index (ETI) edged up in July, after declining in June. The index now stands at 108.11, up from the revised figure of 107.68. The July figure is 5.9-percent higher than a year ago.
(Gartner: Egham, United Kingdom) -- As familiarity with social media grows, customers’ expectations about how organizations will use these channels are evolving, according to Gartner Inc.
(NIST: Gaithersburg, MD) -- The Baldrige Performance Excellence Program announces the opportunity to participate in the pilot of an exciting new assessment service.
(Productivity Press: Boca Raton, FL) -- The success of a lean manufacturing program depends far more on organizationwide leverage of lean manufacturing tools than it does on the tools themselves.
(AMACOM: New York) -- Time-strapped, screen-addicted, value-savvy, and socially engaged, today’s customers are empowered like never before. Their expectations are tougher than ever, and they expect businesses to respect that sense of empowerment—lashing out at those that don’t.
(Mettler-Toledo: Aurora, IL) -- Mettler-Toledo CI-Vision, a leader in the design, manufacture, and installation of machine vision inspection systems for the food, beverage, pharmaceutical, packaging, personal care, and household chemical industries, has launched its new CLS Series for packaged pr
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