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Meggitt Sensing to Exhibit Endevco Sensors at NI Week Conference

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(Meggitt Sensing: Irvine, CA) -- Meggitt Sensing Systems, a Meggitt company and leader in sensing and monitoring systems for extreme environments, will be highlighting its Endevco line of sensors at the upcoming NIWeek conference Aug.

NICE Survey Highlights Opportunities to Engage Service Workers

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(NICE: Ra'anana, Israel) -- NICE Systems, developer of analytic software, has announced that a benchmark study on trends and best practices in frontline performance management indicates that a majority of companies do not use collaboration and gamification to improve employee engagement.

<em>The Lean Six Sigma Black Belt Handbook</em>

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(CRC Press) -- Although Lean and Six Sigma appear to be quite different, when used together they have shown to deliver unprecedented improvements to quality and profitability.

Book Discount Available for NACMA Conference Attendees

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(NIST: Gaithersburg, MD) -- National Institute of Standards and Technology (NIST) authors and CRC Press have arranged to give all attendees at the 2013 North American Coordinate Metrology Association (NACMA) conference a 20-percent discount on the definitive coordinate metrology book,

Distance Measurement Sensors From SICK Offer Increased Mounting Flexibility

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(SICK: Minneapolis) -- SICK, one of the world’s leading manufacturers

New METTLER TOLEDO Microsite

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(METTLER TOLEDO: Columbus, OH) -- METTLER TOLEDO’s Good Weighing Practice (GWP) was introduced in 2007 and presents a scientific approach to safe selection, calibration and operation of weighing equipment.

Address Counterfeit Drug ID in the Field

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(Spectral Evolution: Lawrence, MA) -- The worldwide counterfeit drug market continues to expand, both in developing and developed countries. From fake antimalarial drugs in Africa to counterfeits sold over the Internet, these drugs are detrimental in three primary ways:

Brunson to Exhibit Portable Metrology Products at the 2013 CMSC

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(Brunson: Kansas City, MO) -- Brunson Instrument Co., manufacturer and provider of 3D measurement and alignment solutions, will exhibit their portable metrology accessories at the 29th annual Coordinate Metrology Systems Conference (CMSC), which

CMSC 2013 Will Include 3D Metrology Career Fair, USS Midway Museum Tour

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(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) announced its final schedule of events for the 29th annual Coordinate Metrology Systems C

Quantum Dot Technique Combines Optical and Electron Microscopy

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