PQ Systems Expands Global Presence With World Language Web Pages
(PQ Systems: Dayton, OH) -- PQ Systems, developer of quality control solutions, has launched native language web pages for Mexico, Brazil, Germany, and China.
Registration Opens for the 2014 Coordinate Metrology Systems Conference
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS), the membership association for measurement professionals, has opened registration for the
Spectra-Physics Unveils Ultra-Compact Femtosecond Laser
(Newport Corp.: Irvine, CA) -- Spectra-Physics, a Newport company, introduces HighQ-2, a new ultra-compact, air-cooled, fixed wavelength industrial femtosecond (fs) laser. The ultrafast laser delivers short pulses, high peak power (>190 kW) and a highly focusable beam profile, making i
Workshop to Cover Measurement Solutions for Common Aerospace Challenges
(Hexagon Metrology: North Kingstown, R) -- Hexagon Metrology will co-host a HxGN LIVE on Location workshop with the National Institute for Aviation Research (NIAR).
3D Engineering Solutions, Nikon Metrology Create North American Partnership
(3D Engineering Solutions: Cincinnati) -- 3D Engineering Solutions has partnered with Nikon Metrology to create a first in North America—the first combination of advanced metrology-grade industrial CT scanning capabilities, joined with all the engineering services needed to maximize those capabil
If the Shoe Pinches
Have you ever worn a shoe that doesn’t fit just right? Sometimes, when you first try it on, it appears to fit just fine. As more time goes on though, you notice that it is pinching here and there, creating calluses as you walk, and just doesn’t feel right.
Hexagon Metrology Unveils WLS qFLASH White Light Measurement Solution
[Hexagon Metrology: North Kingstown, RI] -- Hexagon Metrology has announced the release of WLS qFLASH, a compact white light solution (WLS) that utilizes state-of-the-art blue light technology, for industrial measurement applications.
ANSI Approves New Quality Information Framework (QIF) Standard
(DMSC: Burleson, TX) -- On Dec. 19, 2013, the American National Standards Institute (ANSI) approved the Quality Information Framework, v. 1.0 (QIF v1.0) as an ANSI standard.
New Report: ‘Noncontact Scanning: How Data Are Affected by the Decisions We Make’
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has announced the results of its fourth large-scale measurement study performed at the 29th annual Coordin
Next-Generation EVO Delivers Workflow Automation and High-Definition Imaging
(ZEISS: Oberkochen, Germany) -- At the Microscopy and Microanalysis 2013 meeting in Indianapolis, ZEISS launched the next-generation EVO series for material and life science applications.
