Featured Product
This Week in Quality Digest Live
Metrology Features
Marlon Walker
Collaborative robots are already working in close proximity with humans on the shop floor
MIT News
System uses RFID tags to home in on targets; could benefit robotic manufacturing, collaborative drones
Tamper-proof data transmission, traceability of data to all participants in the production process
David L. Chandler
New system of ‘strain engineering’ can change a material’s optical, electrical, and thermal properties

More Features

Metrology News
Diamond styli are an excellent choice for demanding applications
Two key configurations: UH4250 Hardness Scale 0.5-250 kgf and UH4750 Hardness Scale 3-750 kgf
Detects challenging targets with a range up to 2 meters
Control machine performance by detecting manufacturing faults as well as part or tool variations
Low power consumption, solid performance for wide range of applications
New S1 systems offer high volume production testing of compression and extension springs
S-T optical equipment owners encouraged to register their equipment with Dorsey Metrology
They’re spring-loaded AC LVDTs ideal for roundness measurements, automotive testing and materials testing
Works with Marposs LVDT/HVT manual gauges

More News

Quality Digest


Light Measurement Seminar

Published: Wednesday, October 10, 2007 - 22:00

(Labsphere Inc.: North Sutton, New Hampshire) -- Labsphere Inc. is co-sponsoring a light measurement seminar in cooperation with its Halma sister company Ocean Optics, and its sales partner, Pro-Lite Technology.

To be held at the Photonics Cluster in Birmingham, England, on Nov. 1, 2007, the seminar is intended for scientists and engineers working in the field of light source measurements and testing of the optical properties of materials. The seminar will also be of interest to those involved with calibrating remote sensing systems, or evaluating the performance of electronic imaging equipment and detector arrays such as charge-coupled devices (CCDs) and complimentary metal-oxide semiconductor (CMOS) sensors. The all-day event includes presentations and practical demonstrations from industry experts.

The seminar, administered by the Photonics Cluster (UK) and Aston Science Park, requires preregistration.

For more information, visit http://halmapr.com/news/labsphere/2007/09/


About The Author

Quality Digest’s picture

Quality Digest

For 35 years Quality Digest has been the go-to source for all things quality. Our newsletter, Quality Digest, shares expert commentary and relevant industry resources to assist our readers in their quest for continuous improvement. Our website includes every column and article from the newsletter since May 2009 as well as back issues of Quality Digest magazine to August 1995. We are committed to promoting a view wherein quality is not a niche, but an integral part of every phase of manufacturing and services.