Featured Video
This Week in Quality Digest Live
Metrology Features
Ryan E. Day
Simplified workflows and improved features are key to managing growth
James Rawstron
Jet wing surface scan reduced to under four minutes
Michael Huda
How do you control a color that absorbs so much light, spectrophotometers can’t measure it?
Matthew Martin
Traditional CMMs are being challenged by fast-emerging, highly advanced blue-light scanning
Dirk Dusharme @ Quality Digest
Christmas is creeping, should a four-year degree really be the minimum requirement, and what we learn from Disneyland

More Features

Metrology News
Four times faster data acquisition, enabling precise measurement at the submicron level
Caters to the growing need for sophisticated scanning in an entry-level solution that is budget friendly
Topics for the Go Forth and Measure project are virtually unlimited
Ask questions, exchange ideas and best practices, share product tips, discuss challenges in quality improvement initiatives

More News

Dirk Dusharme @ Quality Digest


Inside Quality Digest Live for February 24, 2017

From the birth of computerized spreadsheets to the birth of in-process testing

Published: Monday, February 27, 2017 - 11:02

Businesses don’t have to chose between being “tree huggers” or “planet plunderers.” Black History Month: NIST employee was one of the developers of the computerized spreadsheet. Metrology: process signature analysis and large-field-of-view, multisensor systems. 

“African-American History Month: From Shortstop to Spreadsheets”

Vernon Dantzler wrote many of the subroutines for what became the NIST OMNITAB spreadsheet program. He is profiled by NIST for Black History Month.


Large-field-of-view multisensor measurement

Tom Groff of OGP describes the advantages of multisensor measurement systems and the large-field-of-view Fusion 400 in particular.

“Why Going Green Can Bring in the Green $$$”

Either you’re a job-destroying tree-hugger detached from economic reality, or a planet-plunderer, devastating the environment without a thought to anything except the bottom line. Well, maybe not.

“The Birth of In-Process Testing”

A question in the ’90s: Could process signature analysis be applied in a systematic fashion up and down the whole assembly line? You bet.


Tune in this coming Fri., March 3, 2017, for our next show. You can watch us either on our home page or our dedicated player page. See you there!


About The Author

Dirk Dusharme @ Quality Digest’s picture

Dirk Dusharme @ Quality Digest

Dirk Dusharme is Quality Digest’s editor in chief.