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Machine Learning System Detects Manufacturing Defects Using Photos

A conversation with former Apple engineer Anna Shedletsky

Isaac Maw
Mon, 08/19/2019 - 12:03
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Machine learning can be used for more than violating your privacy for a social media challenge. For example, one fascinating application has been developed by Instrumental AI, which uses machine learning to detect defects and anomalies in photographs of parts during various stages of assembly, primarily in the electronics manufacturing industry.

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Instrumental was founded by Anna Shedletsky, a former Apple engineer with two degrees from Stanford. A mechanical engineer by training, Shedletsky led system products design for the Apple Watch for six years. “I led the team that designed the physical product itself, as well as being responsible for the first production line,” says Shedletsky. “We had to prove mass production yields at mass production speeds on the first line.”


Anna Shedletsky, CEO, Instrumental

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