{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

User account menu
Main navigation
  • Topics
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • 3D Metrology-CMSC
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Contact
    • Training

Air Force Awards Contract to Princeton Infrared Technologies for Research

Investigating hyperspectral imaging on unmanned systems

Tue, 03/07/2023 - 12:00
  • Comment
  • RSS

Social Sharing block

  • Print
Body

(Princeton Infrared Technologies: Monmouth Junction, NJ) -- Princeton Infrared Technologies has been selected by AFWERX, a program office at the Air Force Research Laboratory, for a Small Business Innovation Research (SBIR) Phase II contract in the amount of $749,961 for developing extended-wavelength, short-wave infrared (SWIR) for hyperspectral imaging on unmanned systems. The work will explore Princeton’s potential to fill capability gaps in the U.S. Department of the Air Force (DAF).

ADVERTISEMENT

Hyperspectral imaging in the SWIR wavelength range from 900–1700 nm can be used for applications such as agricultural crop health monitoring and humanitarian aid and logistics. Current hyperspectral systems are expensive due to their use of large-format arrays and complicated optical components. In this program, a micro-lens array (MLA) will be fabricated directly into the detector array substrate. This novel approach will improve alignment accuracy and structural integrity, and is conducive to wafer-scale processing techniques for large-volume production at a significantly reduced cost.

 …

Want to continue?
Log in or create a FREE account.
Enter your username or email address
Enter the password that accompanies your username.
By logging in you agree to receive communication from Quality Digest. Privacy Policy.
Create a FREE account
Forgot My Password

Add new comment

Image CAPTCHA
Enter the characters shown in the image.
Please login to comment.
      

© 2025 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us
  • Contact Us