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New X-ray Measurement Approach Could Improve CT Scanners

Better calibration could make diagnosis more efficient and less costly

NIST
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Wed, 04/03/2019 - 12:01
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A new measurement approach proposed by scientists at the National Institute of Standards and Technology (NIST) could lead to a better way to calibrate computed tomography (CT) scanners, potentially streamlining patient treatment by improving communication among doctors. 

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The approach, detailed in a research paper in the journal PLOS One, suggests how the X-ray beams generated by CT can be measured in a way that allows scans from different devices to be usefully compared to one another. It also offers a pathway to create the first CT measurement standards connected to the International System of Units (SI) by creating a more precise definition of the units used in CT—something the field has lacked.

“If the technical community could agree on a definition, then the vendors could create measurements that are interchangeable,” says NIST’s Zachary Levine, a physicist and one of the paper’s authors. “Right now, calibration is not as thorough as it could be.” 

 …

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