Featured Product
This Week in Quality Digest Live
CMSC Features
Etienne Nichols
What’s the difference?
Atul Minocha
It’s all about ROI
Ryan E. Day
September Speaker Series in review
Ryan E. Day
Realigning a cornerstone of industry
David H. Parker
Practical implications for electronic distance measurement

More Features

CMSC News
Expands simulations for electrification and aerospace design
VSL hosts special edition of show at new center in Rotterdam
Latest line touts comprehensive coverage, ease of use
Blackfly S GigE line grows
Voting for 2022–2023 term will open at CMSC 2022 starting July 25
New facility in Toronto area will showcase multiple Hexagon product lines
API division named ‘Top External Provider 2018’
Exact Metrology selected for project
Faster and more powerful than ever before

More News

Ron Hicks

CMSC

Decades of Top-Shelf Technical Presentations in Portable Metrology

Published: Wednesday, August 21, 2013 - 14:08

For the Coordinate Metrology Society, CMSC 2013 will be recognized as a landmark year in its quest to provide state-of-the-art information and best practices to the metrology industry. Twenty-seven technical presentations were delivered at this conference, and I could not be more impressed with the knowledge and expertise behind them.

CMSC 2013 was held this year in San Diego, California, and its success would not be possible without all the hard work behind the scenes. Members of our Executive Committee generously donate their time and knowledge during the year to promote and progress the goals of the organization we firmly believe in.

In a few months, we will roll into our 30th year of the Coordinate Metrology Systems Conference (CMSC). I have witnessed the hard work of many dedicated people to build a strong foundation, and the enduring support of lifetime members each and every year. It is rare to see an organization that is backed by volunteers last for more than a decade, let alone three!

As a longtime conference attendee, I know the Executive Committee truly listens to the attendees and exhibitors. It takes only a few moments to get their feedback, but it takes a strong organization to really listen and respond to that input. The perfect example of this cooperation is one of our biggest accomplishments—the Level-One Certification Program for Portable 3D Metrology launched at the 2013 CMSC. Our members asked for it, and we responded. I believe this collaboration keeps us strong as an organization. Every voice is important.

I would like to welcome the newest members of our committee, Ron Rode, Keith Bevan, and Nathalie Blanco. We are excited to have you on board and can’t wait to share your knowledge and expertise with the rest of the CMS.

Thank you to Quality Digest for its commitment and support all these years. We appreciate every effort, going above and beyond what we could have ever hoped for.

I hope that you plan to attend CMSC 2014 in the Charleston, North Carolina. I look forward to serving all of you and making sure this year is a success.

Discuss

About The Author

Ron Hicks’s picture

Ron Hicks

Ron Hicks is the 2013–2014 executive committee chairperson of the Coordinate Metrology Society. He is also the president of API Services Inc.