(Bruker: Phoenix) -- At the Microscopy & Microanalysis (M&M) 2012 Annual Meeting, Bruker announced the Dimension FastScan Bio Atomic Force Microscope (AFM), which enables high-resolution microscopy research in biological dynamics. Breakthrough innovations in the design of the FastScan Bio system have resulted in a fast-scanning AFM that allows temporal investigation under physiological operating environments in fluid while exceeding the diffraction limits of optical microscopy.

(Bruker AXS: Tucson, AZ) -- Bruker has created the DektakXT, a new stylus profiler that is the first production system with sustained repeatability of less than five angstroms. This major milestone in stylus-profiler surface metrology performance is the culmination of Dektak’s 40-year legacy of innovation.

(Bruker Corp.: Tucson, AZ) -- At the Materials Research Society (MRS) fall 2010 meeting in late November, Bruker Corp. released AcuityXR, a novel optical surface profiler that combines Bruker hardware and software technology to enable select ContourGT noncontact, 3-D optical surface profilers to break the optical diffraction limit and deliver lateral resolutions that were previously considered impossible to achieve.