Content by Bruker Corp.
AcuityXR Technology Breaks Diffraction LimitContourGT optical surface profilers can now deliver unprecedented lateral resolution
Tue, 11/30/2010 - 13:24
(Bruker Corp.: Boston) -- At the Materials Research Society (MRS) Fall 2010 meeting taking place Nov. 29–Dec.3, Bruker Corp. has unveiled the AcuityXR, an optical surface profiler that combines patent-pending Bruker hardware and software technology…Bruker Announces Three Next-Generation Semiconductor Metrology ProductsNew AFM and X-Ray Systems Enable Industry Transition to Larger, 450mm Wafer Production
Mon, 07/16/2012 - 12:05
(Bruker) -- Today at SEMICON West 2012, Bruker announced three new 450mm X-Ray and AFM semiconductor metrology products to support the industry’s transition to larger wafer production. These new products include the InSight-450 3DAFM from Bruker’s…