Content By Bruker Corp.

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By: Bruker Corp.

(Bruker Nano Surfaces: San Jose, CA and Detroit) -- Bruker Nano Surfaces has announced a partnership with Greening Testing Laboratories of Detroit to provide convenient and cost-effective benchtop friction test and particle-screening capabilities to developers of friction materials.

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By: Bruker Corp.

(Bruker: Santa Barbara, CA) -- Bruker, developer, manufacturer, and provider of scientific instruments and analytical services, has released the new PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes. PeakForce KPFM utilizes frequency-modulation detection to provide the highest spatial resolution Kelvin probe data. It builds on Bruker’s exclusive PeakForce Tapping technology to provide directly correlated quantitative nanomechanical data, which improves the sensitivity of the frequency-modulation measurement and eliminates artifacts.

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By: Bruker Corp.

(Bruker: Phoenix) -- At the Microscopy & Microanalysis (M&M) 2012 Annual Meeting, Bruker announced the Dimension FastScan Bio Atomic Force Microscope (AFM), which enables high-resolution microscopy research in biological dynamics. Breakthrough innovations in the design of the FastScan Bio system have resulted in a fast-scanning AFM that allows temporal investigation under physiological operating environments in fluid while exceeding the diffraction limits of optical microscopy.

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By: Bruker Corp.

(Bruker: Wien, Austria) -- During the 2012 Institute of Scrap Recycling Industries (ISRI) Convention and Exposition held recently in Las Vegas, Bruker, a developer, manufacturer, and provider of scientific instruments and analytical services, introduced the S1 TITAN handheld XRF analyzer. The S1 TITAN is among the lightest (1.44 kg, including battery) tube-based handheld XRF analyzers on the market.

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By: Bruker Corp.

(Bruker AXS: Tucson, AZ) -- Bruker has created the DektakXT, a new stylus profiler that is the first production system with sustained repeatability of less than five angstroms. This major milestone in stylus-profiler surface metrology performance is the culmination of Dektak’s 40-year legacy of innovation.

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By: Bruker Corp.

(Bruker Corp.: Tucson, AZ) -- Bruker Corp.

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By: Bruker Corp.

(Bruker Corp.: Tucson, AZ) -- At the Materials Research Society (MRS) fall 2010 meeting in late November, Bruker Corp. released AcuityXR, a novel optical surface profiler that combines Bruker hardware and software technology to enable select ContourGT noncontact, 3-D optical surface profilers to break the optical diffraction limit and deliver lateral resolutions that were previously considered impossible to achieve.