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CMSC

Metrology

Ed Morse to Deliver Keynote at CMSC 2016

UNC Charlotte professor serves as lead for the PrecisionPath Consortium

Published: Thursday, March 24, 2016 - 08:35

(CMS: Weatherford, TX) -- The Coordinate Metrology Society (CMS) has announced that Ed Morse, Ph.D., professor at UNC Charlotte, will present the keynote address at the 32th annual Coordinate Metrology Society Conference (CMSC), July 25–29, at the Embassy Suites by Hilton in Murfreesboro, TN.

Since 1999, Morse has been a professor of mechanical engineering at UNC Charlotte, pursuing research in tolerancing and metrology. During this time, Morse has further extended his experience to large-scale metrology systems, including laser trackers, photogrammetry, and laser radar systems. He also spent a year at the National Institute of Standards and Technology (NIST), working in the large-scale metrology group from 2007 to 2008. Professor Morse’s areas of specialty are dimensional metrology, coordinate measurement machines, geometric dimensioning and tolerancing (GD&T), and statistical control. He currently serves as a team leader for the PrecisionPath Consortium for Large Scale Manufacturing, along with Ron Hicks, CMS PrecisionPath Chair.

Morse will kick off the 2016 CMSC on Tuesday morning, July 26, with his address covering the work of the PrecisionPath Consortium and its roadmap for the future of metrology and manufacturing. After receiving his bachelor’s degree from Swarthmore College in Pennsylvania, he began his engineering career at Brown and Sharpe Manufacturing Company. He first worked as an application engineer for CMM software, then transitioned into the Advanced Systems group. In 1993, he returned to graduate school at Cornell University, where he earned both his master’s degree and Ph.D. in mechanical engineering. Morse is certified by the American Society of Mechanical Engineers (ASME) as a senior-level GD&T professional.

The Coordinate Metrology Society Conference attracts 3D industrial measurement professionals and scientists with its enviable slate of expert-level technical presentations in the field of metrology. Attendees gather each year to share information and discuss measurement strategies utilized by industries such as aerospace, automotive, shipbuilding, power generation, and more. The CMSC’s packed Exhibition Hall, Measurement, and Educational Zones are prime resources for novices and veterans to learn more about industry best practices, portable 3D coordinate measurement solutions, scientific research and developments, and technology management.

CMSC Call for Papers Continues through March 25, 2016
The CMSC Call for Papers continues until March 25, 2016. Abstract submissions are peer-reviewed by the Coordinate Metrology Society and considered for presentation at 2016 CMSC. Notification of acceptance will occur on April 8, 2016. For guidelines or more information about presenting a technical paper at CMSC 2016, contact Scott Sandwith, technical presentations coordinator at presentations@cmsc.org. Guidelines for presentations and technical papers can be downloaded at 2016 CMSC Guidelines. Conference speakers gain recognition as industry experts, and all accepted white papers are peer reviewed and considered for publication in the prestigious Journal of the CMSC.

For more information on these topics, please see the interview, below, with Rina Molari-Korgel, chairperson of the Coordinate Metrology Society, from Quality Digest Live on March 18, 2016.

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CMSC

The Coordinate Metrology Society (CMS)—presenter of the Coordinate Metrology Society Conference (CMSC)—is comprised of users, service providers, and OEMs of close-tolerance, industrial coordinate measurement systems, software, and peripherals. The metrology systems represented at the annual CMSC include articulated-arm CMMs, laser trackers, laser radar, photogrammetry and videogrammetry systems, scanners, indoor GPS, and laser projection systems. The CMS gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data.