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CMSC

Metrology

Attendee Registration Opens for 2016 Coordinate Metrology Society Conference

July 25–29, 2016, in Murfreesboro, TN

Published: Tuesday, February 2, 2016 - 10:01

(CMSC: Weatherford, TX) -- The Coordinate Metrology Society (CMS), the eminent membership association for 3D measurement professionals, today announced its online attendee registration is open for the Coordinate Metrology Society Conference (CMSC). Held at a different location each year, the CMS will host this year's event at the Embassy Suites by Hilton in Murfreesboro, Tennessee from July 25–29, 2016.

The CMSC is known worldwide for its expert-level, original slate of technical papers and presentations covering measurement and inspection trends, successful applications and innovations in the metrology field, R&D, and industry best practices. All papers are peer reviewed by the CMS Executive Board, and the top selections are published in the prestigious Journal of the CMSC. Registration is now open; click here for more information. Interested exhibitors will find conference details here and should contact exhibits chair Gary Confalone for more information.

The 32nd annual CMSC is a week-long technology conference for users of portable 3D measurement solutions applied by manufacturers and science laboratories. The CMS will offer its proctored Level One and Level Two certification examinations during the event. Certification program guidelines and application forms are available on the CMS website. For additional information on these career enhancement programs, contact certification chair Randy Gruver. Also during the week, the PrecisionPath Consortium for Large-scale Manufacturing will conduct a day-long working meeting led by the CMS and University of North Carolina at Charlotte. Supported by an AMTech Grant from NIST, the industry-driven coalition is developing strategic roadmaps to solve universal technology challenges faced by manufacturers of large, high-precision parts and assemblies. For more information about this exciting initiative, contact CMS committee chair Ron Hicks

CMSC attendees are metrologists, quality control professionals, manufacturing executives and managers, scientists, students, and educators looking to expand their knowledge of 3D portable measurement applications. The Coordinate Metrology Society takes its educational mandate seriously and delivers an extensive Measurement Zone and Education Zone in the exhibition hall. During the week, the CMS also presents metrology challenges, educational workshops, industry updates, a local tour and many networking opportunities. The action-packed CMSC Exhibition Hall will feature the latest in metrology products and services, including industrial photogrammetry, laser trackers, laser radars, articulating arms, laser scanners, laser projection systems, indoor GPS, theodolites, inspection software, and accessories.

CMS call for papers continues through March 11, 2016

The CMSC call for papers continues until March 11, 2016. Abstract submissions are peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2016. Notification of acceptance will occur on April 8, 2016. For guidelines or more information about presenting a technical paper, contact technical presentations coordinator Scott Sandwith. Guidelines for presentations and technical papers can be downloaded at 2016 CMSC Tech Paper Guidelines. Conference speakers gain recognition as industry experts, and all accepted white papers are peer reviewed and considered for publication in the Journal of the CMSC.

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The Coordinate Metrology Society (CMS)—presenter of the Coordinate Metrology Society Conference (CMSC)—is comprised of users, service providers, and OEMs of close-tolerance, industrial coordinate measurement systems, software, and peripherals. The metrology systems represented at the annual CMSC include articulated-arm CMMs, laser trackers, laser radar, photogrammetry and videogrammetry systems, scanners, indoor GPS, and laser projection systems. The CMS gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data.