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Designed for high-throughput X-ray inspection
Nikon Metrology NV Published: 11/10/2009
(Nikon Metrology NV: Leuven, Belgium) -- Nikon Metrology NV announces the compact, yet versatile, XT V 130 X-ray inspection system that efficiently traces failures inside complex electronic devices and multilayer circuit boards.
To maintain highest quality standards in an environment of continuous miniaturization, electronics manufacturers prefer deploying intuitive, reliable, and efficient X-ray imaging capability in-house.
The XT V 130 is a compact and affordable X-ray system for automated quality assurance on serial-produced electronic samples. The XT V 130 inspection system will be demonstrated in a premiere at the Productronica show in Munich (Nov. 10–13).
Hidden electronic defects that arise during production or assembly generally result in system failure, fabrication delay, and additional cost. These defects can be detected efficiently early on in the process by taking an in-depth look at the inside of electronic specimens. Designed for high-throughput electronics X-ray inspection, the XT V 130 allows operators to provide instant pass/fail status. Automated inspection functions and (optional) automatic board identification ensure high inspection throughput rates. Inspection reports compliant with material requirements planning (MRP) systems facilitate tight integration into customers’ manufacturing processes. Today, any OEM and subsystem supplier of consumer, automotive, aerospace, medical, and electronics can take advantage of X-ray inspection technology.
The system comes with a 30–130 kV open microfocus X-ray source, a four-axis programmable manipulator, and a 16-bit imaging system based on a four-inch image intensifier. A focal spot size down to three micron, 320X geometric magnification, and tilt angle of up to 60°, offer excellent image quality and flexibility. A rotatary stage and computed tomography (CT) capability are available as options. A hinged door provides easy access to the inspection area, which fits samples up to 40 cm x 35 cm (16 x 14 in.).
Using qualitative real-time X-ray capabilities, operators intuitively navigate through the layers of a printed circuit board (PCB) or inside electronic devices, by changing position, angle, and zoom as desired, using the joystick. The XT V 130 system is ideally suited to quickly trace material inconsistencies, connectivity issues, incomplete through-layer vias, and other failures.
Intuitive operation of the compact XT V 130 system is controlled by Inspect-X, the powerful proprietary software used on all XT systems from Nikon Metrology NV. Inspect-X is known for its powerful X-ray image processing and analysis as well as the broad set of automation capabilities that are included. Developed to streamline the inspection process with ultrafast X-ray acquisition, the XT V 130 runs first article inspection in minutes, instead of hours or days.
Besides easy operation, the XT V 130 system offers low cost of ownership. The open X-ray tube installed in the system allows for quick replacement of low-cost filaments. All serviceable components are installed on a drawer that can be opened from the front, making the system very easy to service. Thanks to its footprint, which is limited to just 1 m2, a built-in generator, and weight below 1,150 kg, the XT V 130 system easily fits any electronics production area without requiring high-voltage power or special floor conditions. The system’s protective enclosure puts safety first, avoiding the use of dedicated badges or protective clothing.
In Nikon Metrology NV’s range of electronic X-ray systems, which originate from the renowned X-ray system manufacturer X-Tek, the XT V 130 is a quality assurance machine with an optimum performance-price ratio. It ideally complements the top-line XT V 160 system, previously named X-Tek Revolution, a powerful research and development and production engineering system featuring a superb nanotech 160 kV X-ray source. The possibility to configure a flat panel imager enables the system to acquire images with the highest resolution. In addition, the XT V 160 offers CT capability, a market-leading 75°-tilt angle, and a standard rotate stage with true concentric imaging to readily reveal and resolve weak points in the PCB manufacturing process.
Recently, the design of the top line XT V 160 system has been further enhanced based on customer feedback. To obtain faster access to the inspection area and better viewing of the sample, the sliding window is replaced by a standard door and window combination. This modification also allows larger samples to be inserted into the system and provides easier access to the gun for filament changes. To simplify system operation, all controls have been centralized into a single easy-to-use panel. The sample manipulator has been strengthened further to make concentric movement of the sample even more accurate and stable.
Overall, Nikon Metrology NV has a worldwide install base of approximately 1,500 X-ray and CT systems.
Nikon Metrology NV offers the most complete and innovative metrology product portfolio, including state-of-the-art 2.5D vision measuring systems complemented with optical and mechanical 3-D metrology solutions. These reliable and innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in consumer, automotive, aerospace, electronics, medical, and other industries. Systems are available in both fixed and portable configurations, equipped with a single or multiple sensors.
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